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Creators/Authors contains: "Arulanandam, Madhan K"

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  1. ; ; ; ; ; ; (, MethodsX)
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  2. ; ; ; ; ; ; (, IEEE Journal of Photovoltaics)
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  3. ; ; ; ; ; ; (, 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC))
    An intricate look is taken at the methods used to account for variance in minority-carrier lifetime in the silicon bottom cell of II-VI/Si tandem solar cells. A discussion on the modeling is provided. Lateral wafer variance is determined to be much less than wafer-to-wafer variance. Size testing indicates a minimum size of 4 × 4 cm is necessary for accurate results. The cleaning procedure and photoluminescence testing is described. Despite a small sample size, Si samples with CdTe deposition and CdCl2 treatment maintain over 1 ms lifetimes, enabling the Si bottom cell in II-VI/Si tandem cells to reach state-of-the-art performance. 
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